Home › Presentation › General Meeting Presentations › 2017 General Meeting Presentations › 2017 Fall General › NYOUG 2017 Fall General Meeting: Improving reliability using the next generation machine learning technologies

NYOUG 2017 Fall General Meeting: Improving reliability using the next generation machine learning technologies

Posted on Posted in 2017 Fall General, 2017 General Meeting Presentations Tagged with , ,

Improving reliability using the next generation machine learning technologies

The participants will learn how machine learning can be used to reduce the effort required to troubleshoot multiple issues across the technology stack. Learn why you need to monitor the system as a whole, not just the database, or OS, or middleware or …..

Erik Benner
Erik is currently an Oracle ACE Director with years of experience in the Oracle technology stack. Erik presents frequently at conferences, including Oracle OpenWorld, Oracle FedForum, COLLABORATE and other user groups and conferences around the United States. When not flying to the far points of the country from the Atlanta Metro area, he enjoys spending time with his family at their Observatory, where the telescopes outnumber the people.

Related posts:

  1. NYOUG 2018 Fall General Meeting: Next Generation Data Protection and Security for Oracle users: The Blockchain Advantage
  2. NYOUG 2017 Fall General Meeting: KEYNOTE: Mitigating the Oracle License Sprawl by Applying Advanced Technology
  3. NYOUG 2017 Summer General Meeting: Using Machine Learning in OBIEE for Actionable BI
  4. NYOUG 2017 Winter General Meeting: Your users are your security perimeter. Understanding the Next Generation of Cloud Security Technologies